NiCr 80:20 Sputtering Target 99.95% 3 in Lab ATOMFAIR®

$645.00

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Research-grade NiCr(80:20 wt%) sputtering target, 99.95% purity, 3 in diameter x 0.25 in thick for DC/RF magnetron deposition and thin-film work. Order now.

Nickel-Chromium Alloy Sputtering Target (NiCr(80:20 wt%))
Product Type: Metal alloy sputtering target
Research-grade laboratory product
Product Overview

Nickel-Chromium Alloy Sputtering Target (NiCr(80:20 wt%)) combines the NiCr(80:20 wt%) alloy composition with a source-listed purity of 99.95% and a target size of 3 indiameter x 0.25 in/2 indiameter x 0.25 in.

The target is supplied for vacuum coating workflows using magnetron sputtering, vacuum plating and related deposition methods. Confirm the selected composition, dimensions, substrate system and quantity for the intended coating process.

Performance Features
  • NiCr alloy with 80:20 wt% composition ratio, enabling stoichiometric transfer to deposited films within ±2 at% under optimized sputtering conditions.
  • 99.95% (3N5) purity with total metallic impurities <500 ppm and O+N <100 ppm, minimizing contamination and improving deposited film resistivity and adhesion.
  • Optimized for DC/RF magnetron sputtering at 3-15 W/cm² (DC) or 1-5 W/cm² (RF) under 0.5-2.0 Pa Ar atmosphere, achieving deposition rates of 10-80 nm/min with ±5% thickness uniformity across a 100 mm substrate.
  • Suitable for thin-film resistors, diffusion barriers and magnetic thin-film devices, with deposited films exhibiting adhesion strength >15 MPa (ASTM D4541 pull-off) on properly prepared substrates.
Technical Specifications
Parameter Specification / Available Values
Atomfair Model AF-NI-NICS
Material / Formula NiCr(80:20 wt%)
Purity 99.95%
Target Size 3 indiameter x 0.25 in/2 indiameter x 0.25 in
Relative Density ≥95% of theoretical
Grain Size ≤ 50 µm (fine-grained)
Deposition Method DC / RF Magnetron Sputtering
Max Power Density 3-15 W/cm² (DC) / 1-5 W/cm² (RF)
Bonding Type Indium bonding / Elastomer bonding (optional)
Backing Plate Oxygen-free copper / CuCrZr (optional)
Surface Finish Machined, Ra ≤ 0.8 µm
Thickness Tolerance ± 0.1 mm
Manufacturing Method Vacuum induction melting / Casting
Product Category Metal alloy sputtering target
PROCUREMENT CHECK: Confirm target specifications — purity, dimensions, composition ratio and bonding requirements — against your deposition system before ordering.
INQUIRY NOTE: Include the model number, target dimensions, purity grade and required quantity when requesting a quotation.
LABORATORY PROCUREMENT SUPPORT
INQUIRY: inquiry@atomfair.com
Manufacturer: Atomfair LLC
Brand: ATOMFAIR®

This document defines the operating and compatibility constraints for the NiCr(80:20 wt%) sputtering target. Use these constraints to verify the target is suitable for the intended deposition process.

  • Deposition Process Parameters: Sputter at 3-15 W/cm² DC or 1-5 W/cm² RF under a 0.5-2.0 Pa Ar atmosphere to achieve the stated deposition rate and uniformity.
  • Stoichiometric Transfer Constraint: Maintain optimized sputtering conditions to keep the NiCr(80:20 wt%) stoichiometric transfer within ±2 at% in the deposited film.
  • Substrate Preparation Requirement: Use properly prepared substrates to achieve deposited film adhesion strength greater than 15 MPa by ASTM D4541 pull-off testing.
  • Mounting and Bonding Constraint: Confirm indium or elastomer bonding and oxygen-free copper or CuCrZr backing plate selection against the deposition system before ordering.

This procedure describes the setup and operation of the NiCr(80:20 wt%) sputtering target in a magnetron deposition system. Follow the stated power-density and argon-pressure ranges to achieve the specified deposition behavior.

Required Equipment: DC/RF magnetron sputtering system, Argon gas supply

  1. Confirm compatibility
    Confirm the target composition, dimensions, and bonding requirements against the deposition system before mounting.
  2. Install target
    Install the target using the selected backing plate and bonding type (indium or elastomer).
  3. Set argon pressure
    Set the sputtering chamber argon pressure to 0.5-2.0 Pa before deposition.
  4. Apply sputtering power
    Apply DC power at 3-15 W/cm² or RF power at 1-5 W/cm² to initiate deposition.
  5. Monitor deposition
    Monitor the deposition rate within 10-80 nm/min and verify thickness uniformity across a 100 mm substrate.

What is the stoichiometric transfer accuracy of NiCr(80:20 wt%) films deposited with this sputtering target?

Under optimized sputtering conditions, the target enables stoichiometric transfer to deposited films within ±2 at%. This is supported by the NiCr(80:20 wt%) composition, 99.95% (3N5) purity with total metallic impurities <500 ppm and O+N <100 ppm, minimizing contamination and preserving film resistivity and adhesion.

What target size and bonding options are available for this NiCr sputtering target to ensure compatibility with my deposition system?

The target is supplied in two size options: 3 in diameter x 0.25 in and 2 in diameter x 0.25 in. Bonding options include indium bonding or elastomer bonding, and backing plate materials are oxygen-free copper or CuCrZr. Confirm dimensions, bonding type, and backing plate material against your system before ordering.

What are the recommended sputtering parameters and infrastructure requirements for this NiCr target?

The target is optimized for DC/RF magnetron sputtering at 3–15 W/cm² (DC) or 1–5 W/cm² (RF) under an Ar atmosphere of 0.5–2.0 Pa. Deposition rates of 10–80 nm/min are achieved with ±5% thickness uniformity across a 100 mm substrate. Ensure your system can maintain these pressure, power, and atmosphere conditions for optimal film quality.

This NiCr(80:20 wt%) sputtering target offers 99.95% purity with fine grain structure and optimized deposition rates for DC/RF magnetron sputtering, requiring careful system compatibility verification for bonding and backing plate options.

Positive

  • High purity and fine grain: 99.95% (3N5) purity with total metallic impurities <500 ppm and O+N <100 ppm, combined with ≤50 µm grain size and ≥95% relative density, minimizing contamination and improving film resistivity and adhesion.
  • Optimized deposition performance: DC/RF power density ranges (3-15 W/cm² DC, 1-5 W/cm² RF) under 0.5-2.0 Pa Ar yield deposition rates of 10-80 nm/min with ±5% thickness uniformity across a 100 mm substrate, suitable for thin-film resistors, diffusion barriers, and magnetic devices.

Trade-offs

  • System compatibility verification needed: Bonding type (indium or elastomer) and backing plate material (oxygen-free copper or CuCrZr) are optional but must be confirmed against the sputtering system, along with target dimensions and composition, before ordering to ensure proper fit and performance.
  • Operating parameter constraints: Optimal deposition requires strict adherence to power density limits (3-15 W/cm² DC, 1-5 W/cm² RF) and Ar pressure range (0.5-2.0 Pa); deviations risk reduced deposition rate, uniformity, or target damage.

Every advanced material, component, equipment, and instrument in our catalog is backed by rigorous testing. We maintain strict internal quality management frameworks and align with CE conformity metrics to deliver transparent, reproducible performance data via our public open-science repository.

To request raw batch performance data, submit formal vendor registration paperwork, or execute a fast-turnaround R&D manufacturing loop, contact us at inquiry@atomfair.com.

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