Yttria-Stabilized Zirconia (100) DSP Substrate ATOMFAIR®

Price range: $34.99 through $120.99

Institutional Procurement & Supply Compliance: As a verified US supplier, Atomfair accepts formal institutional Purchase Orders (POs), contract billing schedules, and custom procurement loops for university and national laboratories, and corporate R&D departments globally.

Research-grade YSZ single-crystal substrate with (100) orientation, DSP finish, 99.99% purity, ±0.5° tolerance, <5Å roughness, and 5 × 5 to 10 × 10 mm. Order now.

Yttria-Stabilized Zirconia Single Crystal Substrate, (100), DSP (10 pcs/box)
Product Type: YSZ single crystal substrate
Research-grade laboratory product
Product Overview

Yttria-Stabilized Zirconia Single Crystal Substrate, (100), DSP is offered with 3 selectable specification options under the same orientation (100) and surface finish DSP. Buyers select the required size, thickness, offcut, or notation option from the specification list.

Specification Selection
  • Selectable attribute: Specification.
  • Fixed specification identity: orientation (100) and surface finish DSP.
  • Choose the required listed option before requesting quotation.
Technical Specifications
Parameter Specification / Available Values
Atomfair Model AF-YSZ100-DSP
Fixed specification identity orientation (100) and surface finish DSP
Available specification options 3
Material YSZ / Yttria-Stabilized Zirconia
Chemical formula Y-stabilized ZrO2
Crystal structure Cubic
Lattice constant 5.125Å
Crystal purity 99.99%
Melting point 2800°C
Density 5.8 g/cm3
Thermal expansion coefficient 10.3 × 10-6 /°C
Dielectric constant 27
Growth method Arc melting method
Orientation tolerance ±0.5°
Surface roughness < 5Å
Available Specifications
Model No. Specification Option
AF-YSZ100-10X10D 10 × 10 × 0.5 mm
AF-YSZ100-5X5D 5 × 5 × 0.5 mm
AF-YSZ100-10X10X1D 10 × 10 × 1.0 mm
MATERIAL MATCHING: Confirm that the selected substrate material and crystal family match the target thin-film or device workflow before quotation.
SPECIFICATION REVIEW: Confirm orientation, dimensions, thickness, polishing condition, offcut details, quantity, and any custom requirements for the selected option.
QUOTATION DETAILS: Include the selected specification option and required quantity when contacting Atomfair.
LABORATORY PROCUREMENT SUPPORT
For material matching, specification review, model selection or configuration confirmation, contact our technical sales team.
E-MAIL: inquiry@atomfair.com
Manufacturer: Atomfair LLC
Brand: ATOMFAIR®

The substrate orientation and surface finish must be confirmed to match the target thin-film or device workflow. All specification parameters including dimensions, thickness, polishing condition, and offcut details must be verified before quotation.

  • Material Matching: Confirm that the selected substrate material and crystal family match the target thin-film or device workflow to ensure compatibility.
  • Specification Review: Verify orientation, dimensions, thickness, polishing condition, offcut details, and any custom requirements for the selected substrate option.

What is the significance of the surface roughness <5 Å on the YSZ single crystal substrate for thin-film deposition?

The surface roughness of less than 5 Å ensures an atomically smooth surface critical for high-quality epitaxial growth of thin films. The substrate is double-side polished (DSP) with a roughness specification of <5 Å, as stated in the technical specifications.

How does the lattice constant of 5.125 Å for the YSZ (100) substrate influence epitaxial film selection?

The lattice constant of 5.125 Å (cubic) determines the lattice mismatch with candidate thin-film materials. Researchers must calculate mismatch to the target film's lattice parameters to ensure epitaxial compatibility. The substrate is available with orientation tolerance ±0.5°, and the material is Yttria-Stabilized Zirconia with cubic crystal structure.

What are the critical handling requirements for maintaining the <5 Å surface quality of the YSZ single crystal substrate?

The substrate has a surface roughness <5 Å and is double-side polished (DSP), requiring careful handling to avoid contamination or damage. The product is supplied as 10 pcs/box, and the technical specifications state orientation tolerance ±0.5° and crystal purity of 99.99%.

Yttria-stabilized zirconia single crystal substrate with (100) orientation and DSP surface finish, offering 99.99% purity, cubic structure, and <5Å roughness for demanding thin-film and epitaxial growth applications.

Positive

  • High purity and crystalline quality: 99.99% crystal purity with cubic structure and surface roughness <5Å, enabling high-quality epitaxial thin-film deposition.
  • Exceptional thermal stability: Melting point of 2800°C and thermal expansion coefficient of 10.3 × 10⁻⁶/°C support high-temperature processing and thermal cycling.

Trade-offs

  • Orientation tolerance constraint: Orientation tolerance of ±0.5° may require precise alignment for applications demanding exact crystallographic registry.
  • Specification selection required: Three available size options (10×10×0.5mm, 5×5×0.5mm, 10×10×1.0mm) necessitate careful specification review to match experimental geometry.

Every advanced material, component, equipment, and instrument in our catalog is backed by rigorous testing. We maintain strict internal quality management frameworks and align with CE conformity metrics to deliver transparent, reproducible performance data via our public open-science repository.

To request raw batch performance data, submit formal vendor registration paperwork, or execute a fast-turnaround R&D manufacturing loop, contact us at inquiry@atomfair.com.

Item is dispatched under the Atomfair Shipping & Delivery Framework (Free worldwide shipping on orders over $59 USD excl. heavy equipment). Return is governed by the Atomfair Return & Refund Policy (7-day technical return window).

Specification

10 × 10 × 0.5 mm, 5 × 5 × 0.5 mm, 10 × 10 × 1.0 mm

Related Products