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LSAT Single Crystal Substrate, (111), SSP (10 pcs/box)
Product Type: LSAT single crystal substrate
Research-grade laboratory product
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LABORATORY PROCUREMENT SUPPORT
For material matching, specification review, model selection or configuration confirmation, contact our technical sales team.
E-MAIL: inquiry@atomfair.com
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Manufacturer: Atomfair LLC
Brand: ATOMFAIR®
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The LSAT single crystal substrate requires precise material matching to the target thin-film system to ensure lattice and thermal compatibility. The orientation tolerance of ±0.5° and surface roughness below 5 Å are critical parameters that must be verified before use.
- Material Matching: Confirm that the selected substrate material and crystal family match the target thin-film or device workflow before quotation.
- Orientation Tolerance: Verify that the orientation tolerance of ±0.5° is within acceptable limits for the intended deposition process.
- Surface Roughness: Ensure that the surface roughness Ra < 5 Å is suitable for the required epi-ready condition.
What are the orientation tolerance and surface roughness specifications for the LSAT (111) single crystal substrate, and how do they impact thin-film quality?
The orientation tolerance is ±0.5° and the surface roughness is Ra < 5 Å. These tight tolerances ensure high-quality epitaxial growth with minimal defects, critical for applications in oxide electronics and photonics where precise crystallographic alignment is required.
What is the lattice constant and thermal expansion coefficient of the LSAT substrate, and how do they affect material compatibility for thin-film deposition?
LSAT has a cubic lattice constant of 3.868 Å and a thermal expansion coefficient of 10 × 10⁻⁶/K. These values make it compatible with a range of perovskite oxide materials, minimizing lattice mismatch and thermal stress during epitaxial growth.
What does 'twin-free and no visible domains' mean for the LSAT substrate, and how does the Czochralski growth method contribute to this property?
The substrate is twin-free and has no visible domains, indicating a single-crystal structure without internal structural defects. The Czochralski method used to grow LSAT crystals ensures high crystalline perfection, which is essential for consistent epitaxial film growth and device performance.
LSAT single crystal substrate with (111) orientation and SSP finish suitable for epitaxial growth of oxide thin films; available in 5×5×0.5 mm and 10×10×0.5 mm sizes.
Positive
- Lattice-matched cubic structure: LSAT substrate has a cubic lattice constant of 3.868 Å, closely matching the lattice parameters of many perovskite thin films, minimizing misfit dislocations during epitaxial growth.
- High thermal stability: With a melting point of 1840°C and a thermal expansion coefficient of 10×10⁻⁶/K, the substrate withstands high-temperature deposition processes without significant deformation or thermal mismatch.
Trade-offs
- Orientation tolerance of ±0.5°: The specified orientation tolerance requires precise alignment during epitaxial deposition; deviations may affect film quality, especially for applications demanding exact crystallographic registry.
- Surface roughness sensitivity: The Ra < 5 Å surface finish is highly sensitive to handling and contamination; inadequate cleaning or scratches can degrade epitaxial interface quality.
Every advanced material, component, equipment, and instrument in our catalog is backed by rigorous testing. We maintain strict internal quality management frameworks and align with CE conformity metrics to deliver transparent, reproducible performance data via our public open-science repository.
To request raw batch performance data, submit formal vendor registration paperwork, or execute a fast-turnaround R&D manufacturing loop, contact us at inquiry@atomfair.com.
Item is dispatched under the Atomfair Shipping & Delivery Framework (Free worldwide shipping on orders over $59 USD excl. heavy equipment). Return is governed by the Atomfair Return & Refund Policy (7-day technical return window).
