Atomfair 5*5mm Silicon Carbide (SiC) Substrate

Institutional Procurement & Supply Compliance: As a verified US supplier, Atomfair accepts formal institutional Purchase Orders (POs), contract billing schedules, and custom procurement loops for university and national laboratories, and corporate R&D departments globally.

A square 5*5mm SiC substrate available in industrial, research, and dummy grades. Ideal for small-scale optoelectronic and high-power device applications. Features high thermal conductivity and low defect density.

SKU: AFMSUOJD117
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Description

A square 5*5mm SiC substrate available in industrial, research, and dummy grades. Ideal for small-scale optoelectronic and high-power device applications. Features high thermal conductivity and low defect density.

Parameter Industrial Grade (P Grade) Research Grade (R Grade) Dummy Grade (D Grade)
Dimensions 5*5mm±0.2mm 5*5mm±0.2mm 5*5mm±0.2mm
Thickness 350um±25 um 350um±25 um 350um±25 um
Wafer Orientation Off axis: 2.0°-4.0° toward [1120] ±0.5° (4H/6H-P), On axis:(111)±0.5° (3C-N) Off axis: 2.0°-4.0° toward [1120] ±0.5° (4H/6H-P), On axis:(111)±0.5° (3C-N) Off axis: 2.0°-4.0° toward [1120] ±0.5° (4H/6H-P), On axis:(111)±0.5° (3C-N)
Micropipe Density 0cm² 0cm² 0cm²
Resistivity (4H/6H-P) ≤0.10Ω·cm ≤0.10Ω·cm ≤0.10Ω·cm
Resistivity (3C-N) ≤0.8mΩ·cm ≤0.8mΩ·cm ≤0.8mΩ·cm
Primary Flat Orientation (4H/6H-P) {10-10}±5.0° {10-10}±5.0° {10-10}±5.0°
Primary Flat Orientation (3C-N) {1-10}±5.0° {1-10}±5.0° {1-10}±5.0°
Primary Flat Length 15.9mm±1.7mm 15.9mm±1.7mm 15.9mm±1.7mm
Secondary Flat Length 8.0mm±1.7mm 8.0mm±1.7mm 8.0mm±1.7mm
Secondary Flat Orientation 90° CW from Prime flat ±5.0° 90° CW from Prime flat ±5.0° 90° CW from Prime flat ±5.0°
Edge Exclusion 3mm 3mm 3mm
TTV/Bow/Warp ≤2.5μm/≤5μm/≤15μm/≤30μm ≤2.5μm/≤5μm/≤15μm/≤30μm ≤2.5μm/≤5μm/≤15μm/≤30μm
Surface Roughness (Polish) Ra≤1 nm Ra≤1 nm Ra≤1 nm
Surface Roughness (CMP) Ra≤0.2 nm Ra≤0.2 nm Ra≤0.2 nm
Edge Cracks None 1 allowed, ≤1 mm None
Hex Plates ≤1% cumulative area ≤3% cumulative area ≤3% cumulative area
Polytype Areas None ≤2% cumulative area ≤5% cumulative area
Si Surface Scratches ≤3 scratches, ≤1×wafer diameter cumulative length ≤5 scratches, ≤1×wafer diameter cumulative length ≤8 scratches, ≤1×wafer diameter cumulative length
Edge Chips None ≤3 allowed, ≤0.5 mm each ≤5 allowed, ≤1 mm each
Si Surface Contamination None None None
Packaging Multi-wafer Cassette or Single Wafer Container Multi-wafer Cassette or Single Wafer Container Multi-wafer Cassette or Single Wafer Container

If you are interested or have any questions, please contact us at inquiry@atomfair.com

Disclaimer: Sold exclusively for laboratory research.

Every advanced material, component, equipment, and instrument in our catalog is backed by rigorous testing. We maintain strict internal quality management frameworks and align with CE conformity metrics to deliver transparent, reproducible performance data via our public open-science repository.

To request raw batch performance data, submit formal vendor registration paperwork, or execute a fast-turnaround R&D manufacturing loop, contact us at inquiry@atomfair.com.

Item is dispatched under the Atomfair Shipping & Delivery Framework (Free worldwide shipping on orders over $59 USD). Return is governed by the Atomfair Return & Refund Policy (7-day technical return window).