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A-Plane Sapphire Substrate 4 in 650 μm SSP ATOMFAIR®

A-Plane Sapphire Substrate 4 in 650 μm SSP ATOMFAIR®

$93.00

Institutional Procurement & Supply Compliance: As a verified US supplier, Atomfair accepts formal institutional Purchase Orders (POs), contract billing schedules, and custom procurement loops for university and national laboratories, and corporate R&D departments globally.

A-plane 4 inch (100 mm) single-side polished sapphire substrate, >99.99% Al2O3 KY, 650 ±25 μm thick, Ra <0.3 nm front, <10 μm TTV. Order now.

SKU: AF-WF-S-SAPH-04IN-S017
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Sapphire Substrate – 4 inch (100 mm) A-Plane Single-Side Polished
Product Type: Sapphire substrate
Research-grade laboratory product
Product Overview

4 inch (100 mm) sapphire substrate in A-Plane orientation is supplied as high-purity monocrystalline Al2O3 (KY) with 650 +/- 25 um standard thickness and single-side polished surface preparation.

The wafer geometry includes A-plane 30 mm primary flat or notch configuration, <10 um TTV, <10 um BOW and <15 um WARP for product comparison.
Performance Features
  • High-purity monocrystalline sapphire material with >99.99% purity.
  • Single-Side Polished surface preparation with roughness values differentiated by front and back side.
  • Diameter-specific thickness, primary flat or notch, TTV, BOW and WARP values are presented for specification review.
Technical Specifications
Parameter Specification / Available Values
Atomfair Model AF-SAP-A4SSP
Material >99.99% high-purity monocrystalline Al2O3 (KY)
Orientation A-Plane
Diameter 4 inch (100 mm)
Standard Thickness 650 +/- 25 um
Optional Thickness 225 um, 430 um, 1000 um
Primary Flat / Notch A-plane 30 mm
Polishing Single-Side Polished
Front-Side Roughness Epi-ready, Ra <0.3 nm
Back-Side Roughness Fine ground, Ra <1.2 um
TTV <10 um
BOW <10 um
WARP <15 um
Package 1 piece/set
Selected Specification: Select 4 inch (100 mm), A-Plane, Single-Side Polished and preferred thickness option.
Packaging Details: Package 1 piece/set with available cleaning or packing preferences for this sapphire substrate.
Ordering Details: Share the selected model, configuration, quantity and any thickness or packaging preference.
PRODUCT SELECTION SUPPORT
For model selection, material matching or specification support, contact our technical sales team.
E-MAIL: inquiry@atomfair.com
Manufacturer: Atomfair LLC
Brand: ATOMFAIR®

What are the TTV, BOW, and WARP specifications for the 4-inch A-Plane sapphire substrate?

The TTV is <10 µm, BOW is <10 µm, and WARP is <15 µm as specified for the 4-inch (100 mm) A-Plane single-side polished sapphire substrate from Atomfair.

What are the front-side and back-side surface roughness specifications for this sapphire substrate?

The front-side roughness is Epi-ready with Ra <0.3 nm, while the back-side roughness is fine ground with Ra <1.2 µm, as stated in the product specifications.

What thickness options are available for the 4-inch A-Plane sapphire substrate?

The standard thickness is 650 ± 25 µm, and optional thicknesses include 225 µm, 430 µm, and 1000 µm, as listed in the technical specifications.

The 4-inch A-Plane single-side polished sapphire substrate offers high-purity monocrystalline Al2O3 with epi-ready front surface roughness below 0.3 nm, suitable for epitaxial growth. However, the back-side fine-ground finish and thickness tolerance of ±25 um impose additional handling and specification considerations for advanced applications.

Positive

  • High-purity monocrystalline Al2O3: Material purity >99.99% minimizes impurity-related defects, which is critical for high-performance epitaxial and device fabrication processes.
  • Epi-ready front-side roughness: Front-side roughness Ra <0.3 nm meets epi-ready standards, enabling direct use for thin film deposition without additional polishing steps.

Trade-offs

  • Back-side fine-ground roughness: Back-side roughness Ra <1.2 um may require additional surface preparation for processes needing uniform thermal contact or back-side metallization.
  • Thickness tolerance of ±25 um: The standard thickness tolerance of ±25 um can be a constraint for applications requiring precise optical path length or substrate resonance control.

Every advanced material, component, equipment, and instrument in our catalog is backed by rigorous testing. We maintain strict internal quality management frameworks and align with CE conformity metrics to deliver transparent, reproducible performance data via our public open-science repository.

To request raw batch performance data, submit formal vendor registration paperwork, or execute a fast-turnaround R&D manufacturing loop, contact us at inquiry@atomfair.com.

Item is dispatched under the Atomfair Shipping & Delivery Framework (Free worldwide shipping on orders over $59 USD excl. heavy equipment). Return is governed by the Atomfair Return & Refund Policy (7-day technical return window).

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