Sulfur-doped multiwalled carbon nanotubes, OD 10-30 nm(TEM), length 2-20um(SEM), purity >98 wt%(EDS)Product Type: Multi-walled carbon nanotube material
Research-grade laboratory product
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LABORATORY PROCUREMENT SUPPORT
For model selection, material specification matching, application fit or quotation confirmation, contact our technical sales team.
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Manufacturer: Atomfair LLC
Brand: ATOMFAIR?
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What is the sulfur content of the AF-MWCNT-M78 sulfur-doped multiwalled carbon nanotubes, and how is it determined?
The sulfur content is 2.20 wt% as determined by EDS (Energy Dispersive X-ray Spectroscopy). This level of doping is specified for model matching to experimental requirements in electrode, composite, or catalytic research.
What are the key dimensional specifications of the sulfur-doped MWCNTs that affect their compatibility with dispersion and composite formulations?
The nanotubes have an outer diameter of 10-30 nm (TEM) and a length of 2-20 µm (SEM), with a purity >98 wt% (EDS). These dimensions are critical for achieving uniform dispersion in polymer matrices or electrode slurries and for optimizing percolation thresholds in conductive composites.
Evaluation of AF-MWCNT-M78 as a sulfur-doped multiwalled carbon nanotube powder (OD 10-30 nm by TEM, length 2-20 um by SEM, sulfur content 2.20 wt%, purity >98 wt% by EDS) confirms a defined heteroatom-doped nanocarbon grade suited to dispersion, composite, film, electrode, and conductivity research, with two model codes available for quotation-stage selection.
Positive
- Defined sulfur dopant level: Sulfur-doped multiwalled carbon nanotubes with a stated sulfur content of 2.20 wt% and purity above 98 wt% (EDS) provide a known heteroatom doping level for electrochemistry, catalysis, or composite research.
- Explicit nanoscale geometry specification: An outer diameter of 10-30 nm (TEM) and length of 2-20 um (SEM) are explicitly supplied, allowing researchers to match the material to dispersion, film, electrode, or conductivity workflows requiring a specific CNT dimensional range.
Trade-offs
- Broad dimensional ranges need verification: Diameter and length are specified as wide analytical ranges rather than monodisperse fractions, so lot-level TEM/SEM confirmation may be necessary for size-sensitive formulations or device fabrication protocols.
- Method-dependent diameter and length values: Diameter is reported by TEM while length is reported by SEM; these are different measurement techniques and the resulting values are not directly interchangeable when comparing against data generated by other characterization methods.
Every advanced material, component, equipment, and instrument in our catalog is backed by rigorous testing. We maintain strict internal quality management frameworks and align with CE conformity metrics to deliver transparent, reproducible performance data via our public open-science repository.
To request raw batch performance data, submit formal vendor registration paperwork, or execute a fast-turnaround R&D manufacturing loop, contact us at inquiry@atomfair.com.
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