Atomfair-FTM-638 Thin Film Thickness Meter
Product Overview
Atomfair-FTM-638 is a high-precision thin film measurement device jointly developed with an internationally renowned enterprise. Adopting advanced thin film thickness measurement technology and based on the principle of white light interference, it can accurately determine the thickness of thin films and optical constants (refractive index n, extinction coefficient k). By analyzing the reflection spectrum formed by the coherence of the reflected light from the thin film surface and the reflected light from the thin film-substrate interface, and through professional software fitting calculation, the key parameters of each layer of single-layer or multi-layer film systems can be efficiently obtained. The key components of the equipment are all imported internationally, and the whole machine import solution can also be provided according to customer needs, which is suitable for various precision measurement scenarios of thin films and coatings.
Key Technical Specifications (International Standard)
| No. | Parameter Name | Specific Specifications |
| 1 | Thickness Measurement Range | Film thickness only: 20nm-50μm; Simultaneous measurement of film thickness and optical constants (n,k): 100nm-10μm (slightly different according to the type of thin film material) |
| 2 | Measurement Accuracy | <1nm or <0.5% |
| 3 | Measurement Repeatability | 0.1nm |
| 4 | Wavelength Range | 380nm-1000nm |
| 5 | Measurable Film Layers | 1-4 layers |
| 6 | Sample Size Requirement | Diameter of sample coating area >1.2mm |
| 7 | Measurement Speed | 5s-60s |
| 8 | Spot Diameter | 1.2mm-10mm (adjustable) |
| 9 | Sample Stage Specification | 290mm×160mm |
| 10 | Light Source Configuration | Long-life bromine-tungsten lamp (service life: 2000h) |
| 11 | Optical Fiber Type | Pure quartz wide-spectrum optical fiber |
| 12 | Detector | Imported fiber optic spectrometer |
| 13 | Power Supply Requirement | AC100V-240V, 50HZ-60HZ |
| 14 | Equipment Weight | 18kg |
| 15 | Equipment Dimension | 300mm×300mm×350mm |
Software Function Advantages
User-Friendly Operation: The interface is friendly and intuitive. Users can complete the measurement process with simple clicks without complex professional training.
Efficient Data Processing: Supports fast saving and reading of reflection spectrum data, with powerful data processing capability. A single measurement can simultaneously obtain core data such as the thickness and optical constants of up to 4 layers of thin films.
Rich Material Library: Built-in a large number of optical constant data of conventional materials. Users can conveniently expand the custom material database according to actual needs to adapt to more special measurement scenarios.
Application Scope & Compatible Materials
Application Scenarios
Suitable for the thickness measurement of various thin films and coatings such as dielectrics, semiconductors, thin film filters, and liquid crystals.
Typical Compatible Materials
Thin Film Materials: SiO₂, CaF₂, MgF, photoresist, polycrystalline silicon, amorphous silicon, SiNₓ, TiO₂, polyimide, polymer film, etc.
Substrate Materials: SiGe, GaAs, ZnS, ZnSe, aluminum acrylic acid, sapphire, glass, polycarbonate, polymer, quartz, etc.
Product Design Highlights
Adopting an open structure design, the optical fiber probe can be easily taken out. Through the supporting optical fiber adapter, it can be connected to a microscope with a C-mount interface (microscope needs to be configured separately) to realize the precise measurement of micro-area (>10μm, the specific range is related to the microscope magnification) thin film thickness, adapting to more refined measurement needs.
If you’re interested, have any questions, or have specific customization requirements, please feel free to contact us at inquiry@atomfair.com.
The Atomfair-FTM-638 thin film thickness meter requires sample coating areas exceeding 1.2 mm in diameter and supports film stacks of up to four layers. Simultaneous measurement of thickness and optical constants is constrained to film thicknesses between 100 nm and 10 μm, with accuracy dependent on material type.
- Sample Size Requirement: The coating area on the sample must have a diameter greater than 1.2 mm to obtain a reliable measurement.
- Layer Count Limitation: The instrument cannot analyze film systems with more than four layers; only one- to four-layer stacks are supported.
- Thickness Constraint for Optical Constants: Accurate simultaneous determination of refractive index and extinction coefficient requires film thickness within 100 nm to 10 μm, subject to variation by material type.
What is the difference in thickness measurement range when measuring only film thickness versus simultaneously measuring thickness and optical constants (n,k)?
The Atomfair-FTM-638 measures film thickness alone from 20nm to 50μm. When simultaneously measuring optical constants (n,k), the range is narrowed to 100nm to 10μm, depending on the thin film material type. This trade-off enables higher accuracy for thinner films when only thickness is required, while the simultaneous mode trades range for additional optical parameter data.
Can the Atomfair-FTM-638 be adapted for micro-area measurements on samples smaller than the standard 1.2mm spot?
Yes, the open structure design allows removing the optical fiber probe and connecting it to a microscope with a C-mount interface (microscope not included) to achieve micro-area measurements down to >10μm, depending on microscope magnification. This extends capability beyond the standard adjustable spot diameter of 1.2mm–10mm, making it suitable for refined measurements on small coated areas.
What are the power and physical requirements for setting up the FTM-638 in a laboratory?
The equipment operates on AC100V–240V, 50/60Hz power supply, with no special electrical infrastructure needed. It occupies a footprint of 300mm×300mm×350mm and weighs 18kg, making it suitable for standard benchtop placement. The long-life bromine-tungsten lamp (2000h) and pure quartz optical fiber require minimal routine maintenance under normal lab conditions.
The Atomfair-FTM-638 thin film thickness meter uses white light interference to measure film thickness and optical constants (n, k) across a 20 nm to 50 μm range, with accuracy below 1 nm or 0.5% and repeatability of 0.1 nm. Its open design and optional C-mount microscope adapter enable micro-area measurements, while the built-in material library and multi-layer fitting support up to 4-layer film stacks.
Positive
- High precision and repeatability: Measurement accuracy better than 1 nm or 0.5% with repeatability of 0.1 nm, enabling reliable thin film thickness and optical constant (n, k) characterization for quality control and R&D.
- Multi-layer and micro-area capability: Supports simultaneous measurement of up to 4 film layers and, via the optional C-mount microscope adapter, can measure micro-areas larger than 10 μm, expanding applicability to patterned or small-feature samples.
Trade-offs
- Sample size and stage constraints: The sample coating area must be larger than 1.2 mm in diameter, and the stage is limited to 290 mm × 160 mm, which may restrict measurement of very small or non-standard sized samples.
- Light source lifetime and measurement speed: The bromine-tungsten lamp has a 2000-hour service life, requiring periodic replacement, and measurement time ranges from 5 to 60 seconds, which may be a bottleneck for high-throughput inline inspection.
Every advanced material, component, equipment, and instrument in our catalog is backed by rigorous testing. We maintain strict internal quality management frameworks and align with CE conformity metrics to deliver transparent, reproducible performance data via our public open-science repository.
To request raw batch performance data, submit formal vendor registration paperwork, or execute a fast-turnaround R&D manufacturing loop, contact us at inquiry@atomfair.com.
Item is dispatched under the Atomfair Shipping & Delivery Framework (Free worldwide shipping on orders over $59 USD excl. heavy equipment). Return is governed by the Atomfair Return & Refund Policy (7-day technical return window).
