Atomfair-LSES-739 Fourier Information Optics Experimental System
Product Overview
Atomfair-LSES-739 is a high-performance experimental system belonging to the category of Fourier Information Optics, integrating two core modules: laser speckle photography and electronic speckle interferometry. It is designed to provide precise testing capabilities and in-depth experimental understanding for professionals and researchers in related fields. By leveraging the double-exposure speckle pattern technology, the system enables accurate measurement of the in-plane displacement field on the surface of objects. Furthermore, it extends its applications to strain field testing, stress field testing, distance measurement, speed measurement, internal defect detection of objects, vibration analysis, and other promising areas. Additionally, the system utilizes electronic speckle interferometry to measure the out-of-plane displacement of objects, while facilitating a comparative study between the traditional dry plate exposure method and the computer image processing method. This comparative function helps users gain a profound understanding of the principles of speckle interferometry, making it an ideal tool for both experimental teaching and scientific research.
Key Experimental Contents
- Master the core principles of laser speckle photography.
- Understand the working mechanism of electronic speckle interferometry.
- Learn the operational procedures of the two experimental methods and conduct comparative analysis.
Standard Configuration & Specifications
| No. | Name | Specifications |
|---|---|---|
| 1 | Laser | Helium-neon laser, wavelength 632.8nm, mode TEM., output power >1.5mW, divergence angle <5mrad |
| 2 | Heating Power Supply | Voltage adjustable range: 0V-110V |
| 3 | CCD Camera | PAL system, power supply DC12V, current 1000mA |
| 4 | Image Acquisition Card | Minimum resolution: 640×480×16 |
| 5 | Exposure Timer | Manual timing mode |
| 6 | Beam Expander | Focal length f=4.5mm |
| 7 | Collimator Lens | Focal length f=50mm |
| 8 | Test Objects | 1 piece of heat-deformed sample and 1 piece of force-deformed sample |
| 9 | Other Accessories | Dry plate holder, white screen, ground glass, laser holder, lens holder, two-dimensional adjustment frame, holographic dry plate, etc. |
Note: The above configuration and parameters are for reference only. The final configuration shall be subject to the product packing list. Minor adjustments will not be notified separately.
Optional Configurations
| No. | Name | Specifications |
|---|---|---|
| 1 | Computer | 2.5G dual-core processor, 200G hard disk, 3G memory, independent graphics card |
| 2 | Monitor | LCD monitor |
| 3 | Printer | Standard configuration |
Product Basic Information
- Product Name: Electronic and Laser Speckle Experiment System
- Product Code: Atomfair-LSES-739
- Product Category: Fourier Information Optics
If you’re interested, have any questions, or have specific customization requirements, please feel free to contact us at inquiry@atomfair.com.
What are the key performance specifications of the laser in the Atomfair-LSES-739 system?
The system uses a helium-neon laser with a wavelength of 632.8 nm, operating in TEM00 mode with an output power greater than 1.5 mW and a divergence angle of less than 5 mrad. These specifications ensure a coherent, low-divergence beam suitable for speckle interferometry and photography.
How does the system measure in-plane and out-of-plane displacements?
The system measures in-plane displacement fields using double-exposure speckle photography, which records two speckle patterns on a holographic dry plate before and after deformation. Out-of-plane displacement is measured via electronic speckle interferometry, which compares the interference patterns captured by the CCD camera before and after deformation, enabling quantitative analysis.
What are the infrastructure and handling requirements for operating the Atomfair-LSES-739?
The system requires a stable optical table and a dark environment to prevent stray light interference. The heating power supply operates at 0-110V, and the CCD camera requires a DC12V, 1000mA power source. The included beam expander (f=4.5mm) and collimator lens (f=50mm) must be aligned properly, and the holographic dry plates must be handled in accordance with standard darkroom procedures to avoid fogging.
The Atomfair-LSES-739 integrates laser speckle photography and electronic speckle interferometry in a single platform, enabling quantitative in-plane displacement measurement via double-exposure speckle patterns and out-of-plane displacement analysis through electronic speckle interferometry, with a comparative dry-plate method for educational validation.
Positive
- Dual-mode speckle interferometry: Combines laser speckle photography for in-plane displacement and electronic speckle interferometry for out-of-plane displacement in one system, enabling comprehensive deformation analysis without reconfiguration.
- Comparative dry-plate methodology: Includes a holographic dry plate and holder, allowing side-by-side comparison with computer-based electronic speckle interferometry, which reinforces understanding of speckle interferometry principles in educational settings.
Trade-offs
- Requires external computer system: The system does not include a computer, monitor, or printer as standard; a separate PC with a 2.5G dual-core processor, 200G hard disk, 3G memory, and independent graphics card is required for image acquisition and processing, adding to infrastructure needs.
- Manual timing and adjustment: The exposure timer operates in manual timing mode, and the system uses manual two-dimensional adjustment frames, requiring operator skill for precise alignment and exposure control, which may affect reproducibility in high-throughput testing.
Every advanced material, component, equipment, and instrument in our catalog is backed by rigorous testing. We maintain strict internal quality management frameworks and align with CE conformity metrics to deliver transparent, reproducible performance data via our public open-science repository.
To request raw batch performance data, submit formal vendor registration paperwork, or execute a fast-turnaround R&D manufacturing loop, contact us at inquiry@atomfair.com.
Item is dispatched under the Atomfair Shipping & Delivery Framework (Free worldwide shipping on orders over $59 USD excl. heavy equipment). Return is governed by the Atomfair Return & Refund Policy (7-day technical return window).
