Atomfair-EP108 Ellipsometric Thickness Gauge
Product Basic Information
Product Name: Atomfair Ellipsometric Thickness Gauge
Product Type: Measuring Instrument
Product Overview
With the development of multiple disciplines in modern science and technology, the research and application of various thin films have become increasingly widespread, and the demand for accurate measurement of thin film thickness and optical parameters has become more and more urgent. This product adopts the ellipsometry method for measurement, which boasts the advantages of high sensitivity and precision. As a non-destructive measurement technique, it can simultaneously determine the thickness and refractive index of thin films.
The instrument features manual adjustment, clearly demonstrating the structural functions and adjustment methods of each component of the ellipsometric thickness gauge. It helps users deeply understand the principle and structure of the ellipsometer while cultivating their hands-on operational capabilities.
Core Configuration & Specifications
| No. | Item | Specification |
| 1 | Measurement Range | 1nm – 300nm |
| 2 | Minimum Measurable Value | ≤1nm |
| 3 | Incident Angle | 30°±90°, Error ≤0.1° |
| 4 | Polarizer Azimuth Reading Range | 0°±180° |
| 5 | Dial Scale | 2° per division |
| 6 | Minimum Vernier Reading | 0.05° |
| 7 | Optical Center Height | 152mm |
| 8 | Workbench Diameter | 70mm |
| 9 | Overall Dimensions | 730mm×230mm×290mm |
| 10 | Main Unit Weight | 20kg |
Application & Target Users
Application Scenarios
Ideal for scenarios requiring precise measurement of thin film thickness and optical parameters, including but not limited to scientific research experiments, industrial production quality control, thin film material development, and related technical research fields. It can be adapted according to specific practical needs.
Target Users
Scientific research institutions engaged in thin film material research, including universities, research academies, and specialized material science laboratories.
Enterprises involved in thin film production and processing, such as electronic component manufacturers, optical film producers, semiconductor device fabricators, and coating technology companies.
R&D departments and quality inspection teams in industries related to thin film applications, seeking reliable and accurate thin film measurement solutions.
If you’re interested, have any questions, or have specific customization requirements, please feel free to contact us at inquiry@atomfair.com.
What is the incident angle range of the Atomfair-EP108 ellipsometric thickness gauge, and how does the error tolerance of ≤0.1° affect measurement precision for very thin films?
The incident angle is adjustable from 30° to 90° with an error of ≤0.1°. This angular precision is critical for ellipsometric measurements, particularly for films below 10 nm, where small deviations can significantly alter calculated thickness and refractive index. The manual adjustment requires careful alignment to maintain this accuracy.
Can the Atomfair-EP108 measure films thicker than 300 nm, and what are the limitations of its measurement range?
No, the measurement range is strictly 1 nm to 300 nm; films thicker than 300 nm cannot be reliably measured because ellipsometric parameters lose sensitivity beyond this range. The minimum measurable value is ≤1 nm, making it suitable for ultra-thin films. For thicker films, a different ellipsometer configuration or alternative method is required.
How does the manual vernier reading of 0.05° and dial scale of 2° per division affect the ease of use and potential operator error in polarizer azimuth determination?
The polarizer azimuth reading uses a dial scale with 2° per division and a minimum vernier reading of 0.05°, enabling fine angular adjustment. However, manual operation increases operator dependence and the risk of parallax error; users must be trained to read the vernier accurately to achieve the specified precision. This design is intended to demonstrate ellipsometer principles in an educational context.
The Atomfair-EP108 Ellipsometric Thickness Gauge is a manually adjusted ellipsometer designed for non-destructive thin film thickness and refractive index measurement in the 1-300 nm range, with a minimum measurable value of ≤1 nm and an incident angle accuracy of ≤0.1°. Its manual configuration supports educational and research applications by providing clear insight into ellipsometric principles, while its 20 kg main unit and 730 mm×230 mm×290 mm footprint require stable lab bench space.
Positive
- High-sensitivity non-destructive measurement: The ellipsometry method provides high sensitivity and precision, enabling simultaneous determination of thin film thickness and refractive index without damaging the sample, which is critical for quality control and research applications.
- Educational manual adjustment design: The manual adjustment mechanism clearly demonstrates the structural functions and adjustment methods of each component, supporting hands-on learning of ellipsometer principles and operation in academic and training environments.
Trade-offs
- Manual operation limits throughput: The instrument requires manual adjustment and reading of the polarizer and analyzer, which is time-consuming and operator-dependent, making it less suitable for high-throughput industrial quality control compared to automated systems.
- Narrow thickness range and bench requirements: The measurement range is limited to 1-300 nm, which may not cover thicker films, and the 20 kg main unit with 730 mm×230 mm×290 mm dimensions requires a stable, dedicated bench with sufficient space and vibration isolation for accurate readings.
Every advanced material, component, equipment, and instrument in our catalog is backed by rigorous testing. We maintain strict internal quality management frameworks and align with CE conformity metrics to deliver transparent, reproducible performance data via our public open-science repository.
To request raw batch performance data, submit formal vendor registration paperwork, or execute a fast-turnaround R&D manufacturing loop, contact us at inquiry@atomfair.com.
Item is dispatched under the Atomfair Shipping & Delivery Framework (Free worldwide shipping on orders over $59 USD excl. heavy equipment). Return is governed by the Atomfair Return & Refund Policy (7-day technical return window).
