Atomfair-ESPI-628 Electronic Speckle Pattern Interferometry (ESPI) Experimental Device
Product Overview
Atomfair-ESPI-628 is an advanced modern optical measurement device under the Atomfair brand, categorized under Fourier Information Optics. It integrates computer image processing technology, laser technology, and holographic interferometry technology, serving as a cutting-edge solution in the field of optical measurement. By utilizing speckles—carriers of rough surface information—the device enables precise study of out-of-plane deformation of objects. The high coherence of laser makes speckle phenomena clearly observable, and when paired with a CCD camera, it facilitates efficient computer-based data and image processing. This product has earned wide recognition for its reliable performance and versatile applications.
Key Features
- Compact Structure & Easy Operation: Features a streamlined design that simplifies usage, reducing operational complexity for users.
- High Measurement Precision: Delivers accurate and reliable data, meeting the stringent requirements of professional measurement tasks.
- Non-Contact Measurement: Adopts a non-intrusive measurement method to avoid damage or interference to the measured objects.
- Exceptional Sensitivity: Capable of capturing subtle changes in objects, ensuring no details are overlooked during measurements.
- Rapid Information Processing: Boasts fast data processing speed, significantly enhancing measurement efficiency.
- No Darkroom Required: Eliminates the need for darkroom operations, offering greater flexibility in usage scenarios.
- Real-Time Full-Field Display: Provides real-time visualization of full-field information, enabling intuitive observation of measurement results.
Basic Configuration & Specifications
| Serial Number | Name | Specifications |
|---|---|---|
| 1 | Laser | He-Ne Laser, Wavelength: 632.8nm, Output Power: >1.5mW, Divergence Angle: <5mrad |
| 2 | Heating Power Supply | Voltage Adjustable Range: 0V-110V |
| 3 | CCD Camera | PAL System, Power Supply: DC12V, Current: 1000mA |
| 4 | Image Acquisition Card | Minimum Resolution: 640×480×16 |
| 5 | Beam Expander | Focal Length: f=4.5mm |
| 6 | Beam Splitter | Dimension: 60mm×50mm×6.3mm |
| 7 | 2D Translation Stage | Supports up-down and front-back 2D position adjustment |
| 8 | Test Objects | 1 piece of thermal deformation test piece and 1 piece of mechanical deformation test piece |
| 9 | Other Accessories | Includes universal base, dry plate holder, white screen, reflecting mirror, etc. |
Note: The above configuration and parameters are for reference only. Please refer to the product packing list for the actual specifications. Minor changes may be made without prior notice.
Optional Configurations
| Serial Number | Name | Specifications |
|---|---|---|
| 1 | Computer | Dual-Core Processor (2.5GHz), Hard Disk Capacity: 200G, Memory Capacity: 3G, Equipped with Independent Graphics Card |
| 2 | Monitor | LCD Monitor |
| 3 | Printer | Standard Configuration |
| 4 | Optical Platform | Standard Configuration |
Applications
Atomfair-ESPI-628 is widely applicable in various professional fields requiring high-precision optical measurement, including but not limited to:
- Object Deformation Measurement: Accurately measures the deformation of objects under different conditions, providing essential data for material research and product development.
- Non-Destructive Testing: Enables non-destructive inspection of materials and components, ensuring product quality without causing damage.
- Vibration Measurement: Effectively captures vibration characteristics of objects, supporting research in mechanical engineering, aerospace, and other related fields.
This product is an ideal choice for scientific research institutions, universities, and industrial enterprises engaged in optical measurement and related research and development work.
If you’re interested, have any questions, or have specific customization requirements, please feel free to contact us at inquiry@atomfair.com.
What is the measurement precision and sensitivity of the Atomfair-ESPI-628 for out-of-plane deformation measurement?
The Atomfair-ESPI-628 achieves high measurement precision and exceptional sensitivity, enabling detection of subtle out-of-plane deformations. Its He-Ne laser (632.8nm, >1.5mW) and CCD camera (PAL, DC12V) support real-time full-field display, with the system's non-contact method ensuring no interference with the test object. The device's precision is further enhanced by the beam expander (f=4.5mm) and beam splitter (60mm×50mm×6.3mm), which optimize speckle pattern generation for accurate data capture.
What are the compatibility and integration requirements for the Atomfair-ESPI-628 with existing laboratory infrastructure?
The Atomfair-ESPI-628 requires a computer with a dual-core processor (2.5GHz), 200G hard disk, 3G memory, and an independent graphics card, plus an LCD monitor and printer as optional configurations. It operates without a darkroom, but the CCD camera (PAL, DC12V, 1000mA) and image acquisition card (minimum 640×480×16) must be integrated with the included heating power supply (0-110V) and 2D translation stage. The system is designed for easy setup on a standard optical platform, which is available as an optional accessory.
What are the handling, safety, and storage requirements for the Atomfair-ESPI-628's laser and optical components?
The He-Ne laser (632.8nm, >1.5mW) is a Class 3R laser, requiring standard laser safety precautions such as avoiding direct eye exposure. The system includes a universal base, dry plate holder, white screen, and reflecting mirror; these components should be stored in a clean, dust-free environment to maintain optical alignment. The device operates without a darkroom, but the beam expander (f=4.5mm) and beam splitter (60mm×50mm×6.3mm) must be handled carefully to prevent damage, and the 2D translation stage should be kept calibrated for accurate positioning.
The Atomfair-ESPI-628 integrates a 632.8nm He-Ne laser, CCD camera, and image acquisition card to deliver non-contact, real-time full-field out-of-plane deformation measurement via electronic speckle pattern interferometry, with a compact design that eliminates darkroom requirements and supports rapid data processing for laboratory and industrial applications.
Positive
- Non-contact full-field measurement: The system uses laser speckle interferometry with a CCD camera to measure out-of-plane deformation without physical contact, preventing damage or interference to the test object and enabling real-time full-field visualization.
- No darkroom required: The device is designed to operate without a darkroom, increasing flexibility in laboratory placement and allowing use in standard lighting conditions, which simplifies experimental setup and workflow.
Trade-offs
- Requires external computer system: The basic configuration does not include a computer, monitor, or printer; users must supply a compatible system meeting the specified dual-core processor, 200G hard disk, 3G memory, and independent graphics card requirements to operate the device.
- He-Ne laser safety and alignment: The 632.8nm He-Ne laser with >1.5mW output requires proper beam alignment and safety precautions, and the system's sensitivity to vibration and optical alignment may demand a stable optical platform for optimal measurement accuracy.
Every advanced material, component, equipment, and instrument in our catalog is backed by rigorous testing. We maintain strict internal quality management frameworks and align with CE conformity metrics to deliver transparent, reproducible performance data via our public open-science repository.
To request raw batch performance data, submit formal vendor registration paperwork, or execute a fast-turnaround R&D manufacturing loop, contact us at inquiry@atomfair.com.
Item is dispatched under the Atomfair Shipping & Delivery Framework (Free worldwide shipping on orders over $59 USD excl. heavy equipment). Return is governed by the Atomfair Return & Refund Policy (7-day technical return window).
