Dual-Beam Integrating Sphere Spectrophotometer 250-2500nm for Semiconductor Material Science Research & University Labs

The Atomfair UV-VIS-NIR 739 Integrating Sphere Spectrophotometer (250-2500nm) offers dual-beam continuous scanning, multi-measurement modes, dual high-performance receivers, and multi-language support, ideal for semiconductor, material science, and university research worldwide.

Description

 

Atomfair UV-VIS-NIR 739 Integrating Sphere Spectrophotometer

Product Overview

Atomfair UV-VIS-NIR 739 Integrating Sphere Spectrophotometer is a dual-beam spectrophotometer, which can realize continuous scanning of ultraviolet, visible and near-infrared bands. It is widely used in semiconductor field, material science research, university scientific research and other scenarios, providing accurate testing support for relevant research and applications.

Core Parameters

Wavelength range: 250nm ˜ 2500nm

Grating configuration: Two sets of high-quality holographic gratings, fully covering the entire measurement band

Receiving system: Two sets of high-performance receiving systems to ensure the stability and accuracy of signal reception

Measurement mode: Support multiple measurement modes including reflection, transmission, absorbance and DRS reflection

Optional accessories: Transmission accessories, reflection accessories (optional angles of 5°, 15°, 25°), DRS accessories

Communication mode: USB interface for convenient and stable connection

Software function: With spectrum measurement and photometric measurement functions, support multi-language including Chinese, English, Russian etc.

Applicable Fields

Semiconductor field, material science research, university scientific research, etc.

 

If you’re interested, have any questions, or have specific customization requirements, please feel free to contact us at inquiry@atomfair.com.