Atomfair-EP286 Automatic Ellipsometer Thickness Gauge
Product Basic Information
Product Category: Measuring Instrument
Product Overview
The principle of ellipsometric measurement has a long history. Through continuous improvement and innovation, relevant testing methods and equipment have become increasingly sophisticated, making it an important testing tool in various fields such as optics, materials science, biology, and medicine. Based on ellipsometric technology, this instrument is primarily designed for the precise measurement of thin film materials’ thickness, refractive index, and extinction coefficient. It provides reliable data support for research and production activities across multiple industries, ensuring accuracy and efficiency in critical applications.
Product Features
- Adopts extinction-type ellipsometric measurement method, featuring rigorous measurement logic and stable results.
- High measurement accuracy with full automatic control function, enabling convenient operation and reducing human errors.
- Equipped with a helium-neon laser light source, offering excellent wavelength precision to guarantee high-accuracy measurements.
- Comes with a USB interface for quick connection to computers, facilitating seamless data transmission and device control.
- Paired with professional software that provides multiple sampling data processing methods, meeting the needs of different application scenarios.
- The software is available in two versions: Full Version and Student Version, catering to both scientific research and teaching purposes.
Experimental Application
Capable of conducting Young’s modulus measurement experiments, expanding its usability in academic and research settings.
Core Configuration & Specifications (International Standards)
| No. | Item | Specification |
|---|---|---|
| 1 | Measurement Range | 1nm ~ 4000nm |
| 2 | Minimum Measurable Value | ≤1nm |
| 3 | Coating Refractive Index Range | 1.300 ~ 10.000 |
| 4 | Incident Angle | 40° ~ 90°, Error ≤0.05° |
| 5 | Polarizer Azimuth Reading Range | 0° ~ 180° |
| 6 | Polarizer Step Angle | 0.0375°/step |
| 7 | Measurement Accuracy | ±0.5nm (Under 10nm condition, accuracy ±0.5nm) |
| 8 | Optical Center Height | 75mm |
| 9 | Worktable Diameter | 10mm ~ 120mm |
| 10 | Instrument Thickness | 10mm |
Product Usage
Ideal for thin film characterization in a wide range of industries and research institutions:
- Optics Industry: Used for testing the thickness and refractive index of optical coatings (such as anti-reflective coatings, filter coatings) to ensure optical performance.
- Materials Science: Facilitates the analysis of thin film materials (including polymer films, metal films, semiconductor films) during development and production processes.
- Biomedical Field: Assists in the study of biological thin films (e.g., cell membranes, biomimetic coatings) by providing precise structural parameter data.
- Academic & Teaching: Serves as a practical teaching tool for students majoring in physics, materials science, optics, etc., helping them understand ellipsometric measurement principles and experimental operations.
- Electronic Manufacturing: Supports quality control of thin film layers in electronic components (such as semiconductors, displays) to ensure product reliability.
If you’re interested, have any questions, or have specific customization requirements, please feel free to contact us at inquiry@atomfair.com.
This instrument uses extinction-type ellipsometry to measure thin film properties with a helium-neon laser. The automatic control and software interface enable precise thickness and refractive index determination.
Required Equipment: Atomfair-EP286 Ellipsometer, Computer with USB port, Professional ellipsometry software
- Connect instrument to computer
Connect the instrument to a computer via the USB interface. - Install software
Install the professional ellipsometry software, selecting the Full or Student version as needed. - Configure measurement parameters
Set the incident angle between 40° and 90° and the polarizer azimuth using the software controls. - Place sample on worktable
Place the thin film sample on the worktable (diameter 10–120 mm) and adjust the optical center to 75 mm. - Initiate automatic measurement
Initiate the automatic measurement to record thickness, refractive index, and extinction coefficient. - Analyze data with multi-method processing
Analyze the collected data using the software's multiple sampling data processing methods.
What is the measurement accuracy of the Atomfair-EP286 for film thicknesses above 10 nm?
The manufacturer specifies a measurement accuracy of ±0.5 nm only for films with thickness under 10 nm. For films thicker than 10 nm, no accuracy specification is provided in the product documentation, though the instrument's measurement range extends to 4000 nm.
What are the sample size and mounting constraints for the Atomfair-EP286 ellipsometer?
The worktable accommodates sample diameters from 10 mm to 120 mm, and the optical center height is 75 mm. Samples must have diameters within this range and be positioned so that the measurement area aligns with the fixed optical center height.
What is the difference between the Full Version and Student Version software provided with the Atomfair-EP286?
The product description states that the software comes in two versions: a Full Version for scientific research and a Student Version for teaching purposes. Both versions support multiple sampling data processing methods, but specific functional differences between the versions are not detailed in the provided documentation.
The Atomfair-EP286 Automatic Ellipsometer Thickness Gauge delivers extinction-type ellipsometric measurement with a helium-neon laser source, achieving ±0.5 nm accuracy for films from 1 nm to 4000 nm. Its full automation, USB connectivity, and dual software versions support both research and teaching applications, though the 75 mm optical center height and 10 mm instrument thickness impose sample geometry constraints.
Positive
- High-accuracy extinction-type measurement: The extinction-type ellipsometric method provides rigorous measurement logic and stable results, with accuracy of ±0.5 nm for films under 10 nm, ensuring reliable thin-film characterization.
- Broad measurement range and versatility: Measures film thickness from 1 nm to 4000 nm with a refractive index range of 1.300 to 10.000, supporting diverse applications in optics, materials science, and biomedical research.
Trade-offs
- Fixed optical center height: The 75 mm optical center height limits the maximum sample thickness that can be accommodated, potentially excluding thicker substrates or specialized sample holders.
- Thin instrument profile: With an instrument thickness of only 10 mm, the device may be susceptible to mechanical deformation or require careful handling during setup and alignment.
Every advanced material, component, equipment, and instrument in our catalog is backed by rigorous testing. We maintain strict internal quality management frameworks and align with CE conformity metrics to deliver transparent, reproducible performance data via our public open-science repository.
To request raw batch performance data, submit formal vendor registration paperwork, or execute a fast-turnaround R&D manufacturing loop, contact us at inquiry@atomfair.com.
Item is dispatched under the Atomfair Shipping & Delivery Framework (Free worldwide shipping on orders over $59 USD excl. heavy equipment). Return is governed by the Atomfair Return & Refund Policy (7-day technical return window).
