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Atomfair Czochralski (CZ) method standard thickness silicon wafer 12″ 775um Type P Boron <100> Resistivity 1-40 ohm-cm Surface Finish DSP

Institutional Procurement & Supply Compliance: As a verified US supplier, Atomfair accepts formal institutional Purchase Orders (POs), contract billing schedules, and custom procurement loops for university and national laboratories, and corporate R&D departments globally.

Czochralski (CZ) standard-thickness silicon wafers, produced via the Czochralski crystal growth method, are high-quality monocrystalline silicon substrates. Widely used in semiconductor and photovoltaic industries, they offer reliable performance for integrated circuits and solar cell manufacturing.

SKU: AFMSUSYQ346
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Description

Properties Specification
Diameter 12″
Thickness 775um
Type P
Doping Boron
Orientation <100>
Resistivity 1-40 ohm-cm
Surface Double-side polished
Reference Edge V-notch

Every advanced material, component, equipment, and instrument in our catalog is backed by rigorous testing. We maintain strict internal quality management frameworks and align with CE conformity metrics to deliver transparent, reproducible performance data via our public open-science repository.

To request raw batch performance data, submit formal vendor registration paperwork, or execute a fast-turnaround R&D manufacturing loop, contact us at inquiry@atomfair.com.

Item is dispatched under the Atomfair Shipping & Delivery Framework (Free worldwide shipping on orders over $59 USD). Return is governed by the Atomfair Return & Refund Policy (7-day technical return window).

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