Description
Atomfair-ESPI-628 Electronic Speckle Pattern Interferometry (ESPI) Experimental Device
Product Overview
Atomfair-ESPI-628 is an advanced modern optical measurement device under the Atomfair brand, categorized under Fourier Information Optics. It integrates computer image processing technology, laser technology, and holographic interferometry technology, serving as a cutting-edge solution in the field of optical measurement. By utilizing speckles—carriers of rough surface information—the device enables precise study of out-of-plane deformation of objects. The high coherence of laser makes speckle phenomena clearly observable, and when paired with a CCD camera, it facilitates efficient computer-based data and image processing. This product has earned wide recognition for its reliable performance and versatile applications.
Key Features
- Compact Structure & Easy Operation: Features a streamlined design that simplifies usage, reducing operational complexity for users.
- High Measurement Precision: Delivers accurate and reliable data, meeting the stringent requirements of professional measurement tasks.
- Non-Contact Measurement: Adopts a non-intrusive measurement method to avoid damage or interference to the measured objects.
- Exceptional Sensitivity: Capable of capturing subtle changes in objects, ensuring no details are overlooked during measurements.
- Rapid Information Processing: Boasts fast data processing speed, significantly enhancing measurement efficiency.
- No Darkroom Required: Eliminates the need for darkroom operations, offering greater flexibility in usage scenarios.
- Real-Time Full-Field Display: Provides real-time visualization of full-field information, enabling intuitive observation of measurement results.
Basic Configuration & Specifications
| Serial Number | Name | Specifications |
|---|---|---|
| 1 | Laser | He-Ne Laser, Wavelength: 632.8nm, Output Power: >1.5mW, Divergence Angle: <5mrad |
| 2 | Heating Power Supply | Voltage Adjustable Range: 0V-110V |
| 3 | CCD Camera | PAL System, Power Supply: DC12V, Current: 1000mA |
| 4 | Image Acquisition Card | Minimum Resolution: 640×480×16 |
| 5 | Beam Expander | Focal Length: f=4.5mm |
| 6 | Beam Splitter | Dimension: 60mm×50mm×6.3mm |
| 7 | 2D Translation Stage | Supports up-down and front-back 2D position adjustment |
| 8 | Test Objects | 1 piece of thermal deformation test piece and 1 piece of mechanical deformation test piece |
| 9 | Other Accessories | Includes universal base, dry plate holder, white screen, reflecting mirror, etc. |
Note: The above configuration and parameters are for reference only. Please refer to the product packing list for the actual specifications. Minor changes may be made without prior notice.
Optional Configurations
| Serial Number | Name | Specifications |
|---|---|---|
| 1 | Computer | Dual-Core Processor (2.5GHz), Hard Disk Capacity: 200G, Memory Capacity: 3G, Equipped with Independent Graphics Card |
| 2 | Monitor | LCD Monitor |
| 3 | Printer | Standard Configuration |
| 4 | Optical Platform | Standard Configuration |
Applications
Atomfair-ESPI-628 is widely applicable in various professional fields requiring high-precision optical measurement, including but not limited to:
- Object Deformation Measurement: Accurately measures the deformation of objects under different conditions, providing essential data for material research and product development.
- Non-Destructive Testing: Enables non-destructive inspection of materials and components, ensuring product quality without causing damage.
- Vibration Measurement: Effectively captures vibration characteristics of objects, supporting research in mechanical engineering, aerospace, and other related fields.
This product is an ideal choice for scientific research institutions, universities, and industrial enterprises engaged in optical measurement and related research and development work.
If you’re interested, have any questions, or have specific customization requirements, please feel free to contact us at inquiry@atomfair.com.
