Description
Atomfair-ONLM-739 Optical Nonlinearity Measuring Instrument
Product Basic Information
- Brand: Atomfair
- Product Model: Atomfair-ONLM-739
- Product Category: Optoelectronics and Laser Field
- Applicable Scenarios: Teaching and scientific research in institutions of higher education
Product Overview
Nonlinear optics is a crucial foundation for the physics of information optoelectronics and photonic devices. The Atomfair-ONLM-739 Optical Nonlinearity Measuring Instrument empowers users to grasp the second-order and third-order nonlinear optical phenomena in crystals and polymer materials. It facilitates the exploration of new phenomena, principles, and methods, providing a solid basis for the research and development of new materials and devices. Meanwhile, it offers strong support for the advancement of new processes, methods, and technologies in device fabrication. Featuring a novel structure, moderate price, and comprehensive functions, this instrument fully meets the core needs of teaching and scientific research in colleges and universities.
Product Features
- Adopts laser Z-scan technology, ensuring advanced and reliable measurement principles.
- Boasts a simple optical path design (single-beam structure) with high measurement sensitivity. It can directly obtain open-aperture, closed-aperture, and light spot information, while simultaneously measuring the nonlinear refractive index and nonlinear absorption coefficient.
- Equipped with multiple detectors (photomultiplier tube, silicon photocell, CCD), comprehensively covering the requirements of optical signal measurement.
- Supports automatic control and testing via computer (Windows multi-screen system), enabling convenient and efficient operation.
- Comes with a variety of dedicated accessories, suitable for the measurement of solid samples, and is equipped with a USB interface for strong compatibility.
Basic Configuration and Technical Parameters
| Serial Number | Configuration Name | International Standard Specifications |
|---|---|---|
| 1 | Measuring Instrument Host | Z-scan range: -50mm~+50mm; Sampling interval: 0.1mm, 0.2mm, 0.5mm, 1mm, 2mm, 5mm; Measurement modes: Transmittance and energy; Scanning speeds: High, medium, low three gears; Scanning methods: Continuous scanning, repeated scanning, time scanning |
| 2 | Photomultiplier Tube Receiver | Spectral response range: 185nm~870nm; Maximum response wavelength: 400±30nm; Multiplication system structure: Mouse-cage type (9 stages); Electron transit time: 22ns |
| 3 | Solid-State Laser | Central wavelength: 532nm; Output power: ＞100mW |
| 4 | Attenuator | Transmittance: 2% |
| 5 | Data Processing Software | Core functions: Spectral background baseline memory, spectral data accumulation operation, spectral data differential operation, spectral scale expansion, normalized transmittance analysis, spectral data smoothing operation, spectral data four arithmetic operations, spectral file management, spectral peak detection, theoretical simulation graph generation |
| 6 | Auxiliary Detection Components | Includes silicon photocell detector, photodiode detector, and supporting samples |
Note: The above configurations and parameters are for reference only. The final configuration shall be subject to the product packing list. No separate notice will be given for minor adjustments.
Optional Configurations
| Serial Number | Configuration Name | International Standard Specifications |
|---|---|---|
| 1 | Computer | Processor: 2.5G dual-core; Hard disk capacity: 200G; Memory capacity: 3G; Display configuration: Independent graphics card |
| 2 | Monitor | Type: LCD monitor |
| 3 | Printer | Standard universal printing device |
Product Applications
This instrument is mainly used in the teaching and scientific research of nonlinear optics in institutions of higher education. It can assist researchers in conducting in-depth studies on nonlinear optical phenomena of various materials (crystals, polymers, etc.), exploring new material properties and device application possibilities, and providing effective experimental tools for the innovation and development of related disciplines. It is an indispensable key equipment in the fields of optoelectronic material research, photonic device development, and nonlinear optical theory verification.
If you’re interested, have any questions, or have specific customization requirements, please feel free to contact us at inquiry@atomfair.com.
