Optimizing 3D monolithic integration for next-generation AI accelerator chips
heterogeneous integration
wafer bonding
deep learning accelerators
thermal management
TSV interconnects
At terahertz oscillation frequencies for next-generation wireless communication chips
terahertz technology
wireless communication
semiconductor design
high-frequency electronics
6G networks
Optimizing atomic layer etching for sub-2nm semiconductor node fabrication
atomic layer etching
semiconductor scaling
nanofabrication
plasma processing
Moore's Law
Engineering self-assembled monolayers for ultra-shallow junction doping in photovoltaics
monolayer doping
photovoltaics
surface chemistry
semiconductor devices
renewable energy
Uniting glacier physics with semiconductor design for ultra-low-power computing chips
glacier physics
semiconductors
low-power computing
bio-inspired design
energy efficiency
Optimizing gate-all-around nanosheet transistors for sub-3nm node performance
nanosheet transistors
sub-3nm node
semiconductor scaling
power efficiency
FinFET alternatives
Optimizing lights-out production through AI-driven predictive maintenance in semiconductor manufacturing
lights-out production
predictive maintenance
semiconductor manufacturing
AI optimization
Industry 4.0
Uniting glacier physics with semiconductor design for cryogenic computing systems
cryogenics
glacier mechanics
semiconductor cooling
quantum computing
thermal management
Atomic layer etching for sub-2nm semiconductor nodes with minimal defect propagation
atomic layer etching
semiconductor fabrication
2nm nodes
defect control
Moore's Law
Preparing for 2032 processor nodes using 3D monolithic integration techniques
processor nodes
3D integration
Moore's Law
semiconductor scaling
monolithic stacking
Bridging current and next-gen AI via hybrid bonding for chiplet integration
hybrid bonding
chiplet integration
AI hardware
next-gen computing
semiconductor technology
Optimizing semiconductor yields through lights-out production and AI-driven defect detection
lights-out production
AI defect detection
semiconductor yield
automated manufacturing
machine learning