High Precision Ellipsometric Thickness Gauge – Atomfair-EP108 Non-Destructive Measurement for Thin Film Thickness & Refractive Index (1nm-300nm)

The Atomfair-EP108 Ellipsometric Thickness Gauge is a high-precision measuring instrument. Adopting ellipsometry, it non-destructively determines thin film thickness and refractive index simultaneously. With a manual adjustment design, it clearly shows component functions and adjustment methods, suitable for scientific research, industrial production and other scenarios, providing accurate measurement solutions for thin film-related fields.

Description

Atomfair-EP108 Ellipsometric Thickness Gauge

Product Basic Information

Product Name: Atomfair Ellipsometric Thickness Gauge

Product Type: Measuring Instrument

Product Overview

With the development of multiple disciplines in modern science and technology, the research and application of various thin films have become increasingly widespread, and the demand for accurate measurement of thin film thickness and optical parameters has become more and more urgent. This product adopts the ellipsometry method for measurement, which boasts the advantages of high sensitivity and precision. As a non-destructive measurement technique, it can simultaneously determine the thickness and refractive index of thin films.

The instrument features manual adjustment, clearly demonstrating the structural functions and adjustment methods of each component of the ellipsometric thickness gauge. It helps users deeply understand the principle and structure of the ellipsometer while cultivating their hands-on operational capabilities.

Core Configuration & Specifications

No. Item Specification
1 Measurement Range 1nm – 300nm
2 Minimum Measurable Value ≤1nm
3 Incident Angle 30°±90°, Error ≤0.1°
4 Polarizer Azimuth Reading Range 0°±180°
5 Dial Scale 2° per division
6 Minimum Vernier Reading 0.05°
7 Optical Center Height 152mm
8 Workbench Diameter 70mm
9 Overall Dimensions 730mm×230mm×290mm
10 Main Unit Weight 20kg

Application & Target Users

Application Scenarios

Ideal for scenarios requiring precise measurement of thin film thickness and optical parameters, including but not limited to scientific research experiments, industrial production quality control, thin film material development, and related technical research fields. It can be adapted according to specific practical needs.

Target Users

Scientific research institutions engaged in thin film material research, including universities, research academies, and specialized material science laboratories.

Enterprises involved in thin film production and processing, such as electronic component manufacturers, optical film producers, semiconductor device fabricators, and coating technology companies.

R&D departments and quality inspection teams in industries related to thin film applications, seeking reliable and accurate thin film measurement solutions.

If you’re interested, have any questions, or have specific customization requirements, please feel free to contact us at inquiry@atomfair.com.