Description
Atomfair MEP 561 Manual Ellipsometric Thickness Gauge
Product Overview
Atomfair MEP 561 Manual Ellipsometric Thickness Gauge adopts extinction method with manual adjustment, which can automatically measure thin film thickness and refractive index. It has the characteristics of high precision, high sensitivity and easy operation. Equipped with a He-Ne laser as the light source with stable power and high wavelength accuracy, the gauge is matched with software supporting table generation, table lookup and precise calculation functions for user convenience, suitable for physics teaching and engineering optics experiment scenarios.
Specifications
| Parameter | Details |
|---|---|
| Thin Film Thickness Measurement Range | 1~300nm |
| Refractive Index Measurement Range | 1~10 |
| Incident Angle Adjustment Range | 20~90掳 |
| Film Thickness Accuracy | ±1nm |
| Refractive Index Repeatability | ±0.01 |
| Dimensions/Weight | 590mm脳390mm脳290mm / 25kg |
Main Configurations
- Atomfair MEP 561 Manual Ellipsometric Thickness Gauge Main Unit
- Control System: Electric Control Box
- Silicon Dioxide (SiO鈧
- Matching Special Measurement and Analysis Software
Customization Service
Exclusive configuration parameters can be customized according to different experimental teaching or scientific research needs of customers.
If you’re interested, have any questions, or have specific customization requirements, please feel free to contact us at inquiry@atomfair.com.
