Description
Atomfair-EP286 Automatic Ellipsometer Thickness Gauge
Product Basic Information
Product Category: Measuring Instrument
Product Overview
The principle of ellipsometric measurement has a long history. Through continuous improvement and innovation, relevant testing methods and equipment have become increasingly sophisticated, making it an important testing tool in various fields such as optics, materials science, biology, and medicine. Based on ellipsometric technology, this instrument is primarily designed for the precise measurement of thin film materials’ thickness, refractive index, and extinction coefficient. It provides reliable data support for research and production activities across multiple industries, ensuring accuracy and efficiency in critical applications.
Product Features
- Adopts extinction-type ellipsometric measurement method, featuring rigorous measurement logic and stable results.
- High measurement accuracy with full automatic control function, enabling convenient operation and reducing human errors.
- Equipped with a helium-neon laser light source, offering excellent wavelength precision to guarantee high-accuracy measurements.
- Comes with a USB interface for quick connection to computers, facilitating seamless data transmission and device control.
- Paired with professional software that provides multiple sampling data processing methods, meeting the needs of different application scenarios.
- The software is available in two versions: Full Version and Student Version, catering to both scientific research and teaching purposes.
Experimental Application
Capable of conducting Young’s modulus measurement experiments, expanding its usability in academic and research settings.
Core Configuration & Specifications (International Standards)
| No. | Item | Specification |
|---|---|---|
| 1 | Measurement Range | 1nm ~ 4000nm |
| 2 | Minimum Measurable Value | ≤1nm |
| 3 | Coating Refractive Index Range | 1.300 ~ 10.000 |
| 4 | Incident Angle | 40° ~ 90°, Error ≤0.05° |
| 5 | Polarizer Azimuth Reading Range | 0° ~ 180° |
| 6 | Polarizer Step Angle | 0.0375°/step |
| 7 | Measurement Accuracy | ±0.5nm (Under 10nm condition, accuracy ±0.5nm) |
| 8 | Optical Center Height | 75mm |
| 9 | Worktable Diameter | 10mm ~ 120mm |
| 10 | Instrument Thickness | 10mm |
Product Usage
Ideal for thin film characterization in a wide range of industries and research institutions:
- Optics Industry: Used for testing the thickness and refractive index of optical coatings (such as anti-reflective coatings, filter coatings) to ensure optical performance.
- Materials Science: Facilitates the analysis of thin film materials (including polymer films, metal films, semiconductor films) during development and production processes.
- Biomedical Field: Assists in the study of biological thin films (e.g., cell membranes, biomimetic coatings) by providing precise structural parameter data.
- Academic & Teaching: Serves as a practical teaching tool for students majoring in physics, materials science, optics, etc., helping them understand ellipsometric measurement principles and experimental operations.
- Electronic Manufacturing: Supports quality control of thin film layers in electronic components (such as semiconductors, displays) to ensure product reliability.
If you’re interested, have any questions, or have specific customization requirements, please feel free to contact us at inquiry@atomfair.com.
