Description
Atomfair AEP 734 Automatic Ellipsometric Thickness Gauge
Product Overview
Atomfair AEP 734 Automatic Ellipsometric Thickness Gauge adopts extinction method for automatic control, which can automatically measure thin film thickness and refractive index with higher measurement precision and sensitivity. Equipped with a He-Ne laser with stable power and high wavelength accuracy, it connects to computer via USB interface and is matched with full-featured special measurement and analysis software, providing diverse data collection and processing methods to meet the needs of different users. It is suitable for physics teaching and engineering optics experiment scenarios.
Specifications
| Parameter | Details |
|---|---|
| Thin Film Thickness Measurement Range | 1~300nm |
| Refractive Index Measurement Range | 1~10 |
| Incident Angle Adjustment Range | 20~90掳 |
| Film Thickness Accuracy | ±1nm |
| Refractive Index Repeatability | ±0.01 |
| Dimensions/Weight | 590mm脳390mm脳290mm / 25kg |
Main Configurations
- Atomfair AEP 734 Automatic Ellipsometric Thickness Gauge Main Unit
- Control System: Electric Control Box
- Silicon Dioxide (SiO鈧
- Matching Special Measurement and Analysis Software
Customization Service
Exclusive configuration parameters can be customized according to different experimental teaching or scientific research needs of customers.
If you’re interested, have any questions, or have specific customization requirements, please feel free to contact us at inquiry@atomfair.com.
