Description
| Specifications | |
|---|---|
| Substrate Material | Silicon Carbide (SiC) |
| Diameter | 2 inch |
| Lattice Mismatch | 3.50% |
| Thermal Expansion Difference | 25% |
| Defect Density | 5×108/cm2 |
| Leakage Current | High |
| Integration Potential | Medium |
Combines SiC’s excellent thermal conductivity with GaN’s high-frequency and low-loss characteristics. Ideal for RF applications including 5G base stations and defense sector power amplifiers.

