Atomfair-LSES-739 Fourier Information Optics Experimental System – High-Precision Displacement & Strain Measurement with Dual Speckle Modules

Atomfair-LSES-739 Electronic and Laser Speckle Experiment System, categorized under Fourier Information Optics, integrates two core modules. It enables precise measurement of object displacement, strain, etc., and supports comparative study of two experimental methods, serving as an excellent tool for scientific research and teaching.

Description

Atomfair-LSES-739 Fourier Information Optics Experimental System

Product Overview

Atomfair-LSES-739 is a high-performance experimental system belonging to the category of Fourier Information Optics, integrating two core modules: laser speckle photography and electronic speckle interferometry. It is designed to provide precise testing capabilities and in-depth experimental understanding for professionals and researchers in related fields. By leveraging the double-exposure speckle pattern technology, the system enables accurate measurement of the in-plane displacement field on the surface of objects. Furthermore, it extends its applications to strain field testing, stress field testing, distance measurement, speed measurement, internal defect detection of objects, vibration analysis, and other promising areas. Additionally, the system utilizes electronic speckle interferometry to measure the out-of-plane displacement of objects, while facilitating a comparative study between the traditional dry plate exposure method and the computer image processing method. This comparative function helps users gain a profound understanding of the principles of speckle interferometry, making it an ideal tool for both experimental teaching and scientific research.

Key Experimental Contents

  • Master the core principles of laser speckle photography.
  • Understand the working mechanism of electronic speckle interferometry.
  • Learn the operational procedures of the two experimental methods and conduct comparative analysis.

Standard Configuration & Specifications

No. Name Specifications
1 Laser Helium-neon laser, wavelength 632.8nm, mode TEM., output power >1.5mW, divergence angle <5mrad
2 Heating Power Supply Voltage adjustable range: 0V-110V
3 CCD Camera PAL system, power supply DC12V, current 1000mA
4 Image Acquisition Card Minimum resolution: 640×480×16
5 Exposure Timer Manual timing mode
6 Beam Expander Focal length f=4.5mm
7 Collimator Lens Focal length f=50mm
8 Test Objects 1 piece of heat-deformed sample and 1 piece of force-deformed sample
9 Other Accessories Dry plate holder, white screen, ground glass, laser holder, lens holder, two-dimensional adjustment frame, holographic dry plate, etc.

Note: The above configuration and parameters are for reference only. The final configuration shall be subject to the product packing list. Minor adjustments will not be notified separately.

Optional Configurations

No. Name Specifications
1 Computer 2.5G dual-core processor, 200G hard disk, 3G memory, independent graphics card
2 Monitor LCD monitor
3 Printer Standard configuration

Product Basic Information

  • Product Name: Electronic and Laser Speckle Experiment System
  • Product Code: Atomfair-LSES-739
  • Product Category: Fourier Information Optics

If you’re interested, have any questions, or have specific customization requirements, please feel free to contact us at inquiry@atomfair.com.