Description
| Specifications | |
|---|---|
| Substrate Material | Silicon (Si) |
| Diameter | 2 inch |
| Lattice Mismatch | 16.90% |
| Thermal Expansion Difference | 56% |
| Defect Density | 1×109/cm2 |
| Leakage Current | High |
| Integration Potential | High |
Available in both normally-on (D-mode) and normally-off (E-mode) configurations. Compatible with traditional Si processes.

