Description
Epitaxial Structure
The InGaP/GaAs HBT epitaxial wafer features a precisely engineered multilayer architecture consisting of (from bottom to top):
(100) GaAs substrate
n-type GaAs subcollector
n-type GaAs collector
p-type GaAs base
n-type InGaP emitter
n-type InGaAs contact layer
This optimized layer stack ensures functional requirements are met for each device region while maintaining excellent lattice matching throughout the structure.
Performance Advantages
Bandgap Engineering: The strategic material selection leverages bandgap differences and doping characteristics to maximize emitter efficiency – a fundamental HBT characteristic governed by ΔEg. This enables flexible device design with superior performance.
GaAs-Based Benefits: As with other GaAs-based HBTs, devices fabricated from this wafer exhibit:
High power density
Low phase noise
Excellent linearity
Single-supply operation capability
Target Applications
While demonstrating slightly lower high-frequency performance compared to pHEMTs, InGaP/GaAs HBTs remain widely deployed in:
Low-frequency wireless systems
Wireless regional area networks (WRAN)
High-efficiency power amplifiers
3G/4G/5G/Wi-Fi/GSM/HPUE mobile devices

