Ellipsometry and Optical Reflectance

Principles of Spectroscopic Ellipsometry

Variable-Angle Spectroscopic Ellipsometry (VASE)

In-Situ Ellipsometry for Real-Time Monitoring

Infrared Spectroscopic Ellipsometry (IRSE)

Mueller Matrix Ellipsometry for Anisotropic Materials

Optical Reflectance Spectroscopy for Bandgap Determination

Spectroscopic Reflectometry for Thin-Film Metrology

UV-Vis-NIR Reflectance for Material Composition Analysis

Surface Roughness Characterization via Optical Reflectance

Ellipsometric Porosimetry for Porous Material Analysis

Dielectric Function Modeling for Ellipsometry Data Analysis

Optical Constants Extraction from Reflectance and Ellipsometry