In Situ Atomic Force Microscopy for SEI Characterization

In situ atomic force microscopy (AFM) provides nanoscale resolution for studying solid electrolyte interphase (SEI) formation and evolution during cycling. Recent advancements have achieved vertical resolution <0.1 nm and lateral resolution <5 nm, enabling detailed mapping of SEI topography and mechanical properties. Studies have shown that SEI thickness varies from 10 nm at low potentials (<0.5 V vs Li/Li+) to >100 nm at high potentials (>4 V vs Li/Li+).

AFM-based mechanical property mapping has revealed that SEI elastic modulus ranges from 0.1 GPa in organic-rich regions to >10 GPa in inorganic-rich regions such as LiF domains . This heterogeneity contributes uneven stress distribution during cycling leading crack formation premature failure . Quantitative analysis shown cracks propagate preferentially through low-modulus regions , highlighting need uniform SEI design .

The combination AFM electrochemical impedance spectroscopy EIS provided insights into relationship between SEI structure ionic conductivity . For example , measurements demonstrated ionic conductivity increases exponentially decreasing thickness , reaching values ~10^-4 S/cm sub-20 nm films . These findings guided development ultrathin artificial SEI layers improve rate performance stability .

In situ AFM also used study dynamic processes such lithium dendrite growth suppression strategies . Real-time imaging revealed dendrite growth rates ~100 nm/s under current densities exceeding C/2 , while application polymer coatings reduced rates by ~90% . These observations informed design protective layers prevent short circuits enhance safety .

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