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Atomic force microscopy for surface characterization

Showing 1-12 of 20 articles

Principles of atomic force microscopy (AFM) operation

AFM probe design and material selection

AFM imaging modes and resolution limits

AFM for mechanical property mapping

AFM in liquid environments

AFM for surface roughness quantification

Electrical characterization via conductive AFM

Magnetic force microscopy (MFM) fundamentals

AFM for nanoscale thermal analysis

High-speed AFM techniques

AFM data analysis and image processing

AFM for 2D material characterization